A must-see for those who want to measure film thickness in water! Underwater film thickness gauge 'FF8'
Measure SiO2 films (silicon oxide films) on Si substrates in air and water! Measurement using the curve fitting method is possible with the thin film analysis option.
The "FF8" is a non-contact underwater thickness gauge that measures the reflectance of samples (interference waveforms) and analyzes thickness values using methods such as FFT (Fast Fourier Transform thickness gauge) and curve fitting thickness gauges. In addition to thickness measurement, it can also measure the thickness and refractive index of films and glass, and with optional features, it can perform multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurements, and component concentration analysis. It can measure SiO2 films (silicon oxide films) on Si substrates in both air and water, and with the thin film analysis option, measurements using the curve fitting method are possible. 【Features】 ■ Measures the reflectance of samples and analyzes thickness values using FFT, etc. ■ Can measure the thickness and refractive index of films and glass in addition to thickness measurement ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can also be used for inline thickness measurements ■ Custom specifications can also be accommodated *For more details, please refer to the PDF materials or feel free to contact us.
- 企業：システムロード
- 価格：Other
